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» Automating the Metamodeling Process
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DAC
2003
ACM
16 years 7 months ago
Learning from BDDs in SAT-based bounded model checking
Bounded Model Checking (BMC) based on Boolean Satisfiability (SAT) procedures has recently gained popularity as an alternative to BDD-based model checking techniques for finding b...
Aarti Gupta, Malay K. Ganai, Chao Wang, Zijiang Ya...
DAC
2004
ACM
16 years 7 months ago
Defining coverage views to improve functional coverage analysis
Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequat...
Sigal Asaf, Eitan Marcus, Avi Ziv
DAC
2004
ACM
16 years 7 months ago
Simultaneous optimization of supply and threshold voltages for low-power and high-performance circuits in the leakage dominant e
Electrothermal couplings between supply voltage, operating frequency, power dissipation and die temperature have been shown to significantly impact the energy-delay-product (EDP) ...
Anirban Basu, Sheng-Chih Lin, Vineet Wason, Amit M...
DAC
2004
ACM
16 years 7 months ago
Retargetable profiling for rapid, early system-level design space exploration
Fast and accurate estimation is critical for exploration of any dece in general. As we move to higher levels of abstraction, on of complete system designs at each level of abstrac...
Lukai Cai, Andreas Gerstlauer, Daniel Gajski
DAC
2004
ACM
16 years 7 months ago
Profile-guided microarchitectural floorplanning for deep submicron processor design
As process technology migrates to deep submicron with feature size less than 100nm, global wire delay is becoming a major hindrance in keeping the latency of intra-chip communicat...
Mongkol Ekpanyapong, Jacob R. Minz, Thaisiri Watew...