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ITC
2003
IEEE
114views Hardware» more  ITC 2003»
15 years 11 months ago
Test-Based Model Generation For Legacy Systems
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....
Hardi Hungar, Tiziana Margaria, Bernhard Steffen
ICCAD
2002
IEEE
146views Hardware» more  ICCAD 2002»
16 years 3 months ago
Test-model based hierarchical DFT synthesis
With increasing design sizes and adoption of System on a Chip (SoC) methodology, design synthesis and test automation tools are hitting capacity and performance bottlenecks. Curre...
Sanjay Ramnath, Frederic Neuveux, Mokhtar Hirech, ...
ISOLA
2004
Springer
15 years 11 months ago
Case Studies with Lurette V2
Abstract. Lurette is an automated testing tool dedicated to reactive programs. The test process is automated at two levels: given a formal description of the System Under Test (SUT...
Erwan Jahier, Pascal Raymond, Philippe Baufreton
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
16 years 19 days ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
ISSTA
2000
ACM
15 years 10 months ago
Simplifying failure-inducing input
Given some test case, a program fails. Which part of the test case is responsible for the particular failure? We show how our delta debugging algorithm generalizes and simplifies...
Ralf Hildebrandt, Andreas Zeller