12745 search results - page 458 / 2549 » Automating test automation |
179
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DSOM
2004
Springer
16 years 8 days ago
2004
Springer
In this paper, we describe an approach for automatically generating configurations for complex applications. Automated generation of system co nfigurations is required to allow lar...
213
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LPNMR
2004
Springer
16 years 7 days ago
2004
Springer
Abstract. Many NP-complete problems can be encoded in the answer set semantics of logic programs in a very concise way, where the encoding reflects the typical “guess and checkâ...
156
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ISQED
2010
IEEE
16 years 6 days ago
2010
IEEE
Abstract—Silicon debug poses a unique challenge to the engineer because of the limited access to internal signals of the chip. Embedded hardware such as trace buffers helps overc...
183
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3DIM
2003
IEEE
16 years 5 days ago
2003
IEEE
Due to their general and robust formulation deformable models offer a very appealing approach to 3D image segmentation. However there is a trade-off between model genericity, mode...
163
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CSB
2003
IEEE
16 years 5 days ago
2003
IEEE
The development of high throughput techniques and large-scale studies in the biological sciences has given rise to an explosive growth in both the volume and types of data availab...