12745 search results - page 317 / 2549 » Automating test automation |
196
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ICST
2008
IEEE
16 years 1 months ago
2008
IEEE
In recent years the development of automotive embedded devices has changed from an electrical and mechanical engineering discipline to a combination of software and electrical/mec...
185
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JAIR
2010
15 years 5 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
165
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
146
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
214
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ISSRE
2007
IEEE
15 years 8 months ago
2007
IEEE
In industrial practice, information on the software field quality of a product is available too late in the software lifecycle to guide affordable corrective action. An important ...