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DAC
2009
ACM
16 years 7 months ago
On systematic illegal state identification for pseudo-functional testing
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
Feng Yuan, Qiang Xu
ICSE
2009
IEEE-ACM
16 years 1 months ago
Guided path exploration for regression test generation
Regression test generation aims at generating a test suite that can detect behavioral differences between the original and the modified versions of a program. Regression test gen...
Kunal Taneja, Tao Xie, Nikolai Tillmann, Jonathan ...
ICCD
2005
IEEE
131views Hardware» more  ICCD 2005»
16 years 3 months ago
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty
KBSE
2008
IEEE
16 years 28 days ago
Random Test Run Length and Effectiveness
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...
HVC
2005
Springer
97views Hardware» more  HVC 2005»
16 years 1 days ago
An Extensible Open-Source Compiler Infrastructure for Testing
Testing forms a critical part of the development process for large-scale software, and there is growing need for automated tools that can read, represent, analyze, and transform th...
Daniel J. Quinlan, Shmuel Ur, Richard W. Vuduc