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17 years 6 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
ICCV
2007
IEEE
16 years 8 months ago
Correspondence Establishment in Statistical Modeling of Shapes with Arbitrary Topology
Correspondence establishment is a key step in statistical shape model building. There are several automated methods for solving this problem in 3D, but they usually can only handl...
Ekaterina Syrkina, Gábor Székely, Mi...
ICCV
2003
IEEE
16 years 8 months ago
Efficient, Robust and Accurate Fitting of a 3D Morphable Model
3D Morphable Models, as a means to generate images of a class of objects and to analyze them, have become increasingly popular. The problematic part of this framework is the regis...
Sami Romdhani, Thomas Vetter
ICPR
2004
IEEE
16 years 7 months ago
On-Line Adaptive Background Modelling for Audio Surveillance
In this paper, we investigate the problem of automatic audio surveillance. This aspect of the surveillance, which extends the more investigated area of video surveillance, can be ...
Marco Cristani, Manuele Bicego, Vittorio Murino
DAC
2008
ACM
16 years 7 months ago
Construction of concrete verification models from C++
C++ based verification methodologies are now emerging as the preferred method for SOC design. However most of the verification involving the C++ models are simulation based. The c...
Malay Haldar, Gagandeep Singh, Saurabh Prabhakar, ...