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» Automatic Generation of Sigma-Protocols
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VLSID
2009
IEEE
150views VLSI» more  VLSID 2009»
16 years 7 months ago
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...
SEMCO
2007
IEEE
16 years 21 days ago
Thematic Role Based Generation of UML Models from Real World Requirements
Model-driven development depends on good initial models. Creating these models by hand is a challenging task, because of complex specification documents and change requests. We p...
Tom Gelhausen, Walter F. Tichy
SEW
2007
IEEE
16 years 21 days ago
A Generative Approach to Building a Framework for Hard Real-Time Applications
The communication and tasking infrastructure of a realtime application makes up a significant portion of any embedded control system. Traditionally, the tasking and communication...
Irfan Hamid, Elie Najm, Jérôme Hugues
QSIC
2006
IEEE
16 years 14 days ago
A Test Data Generation Tool for Unit Testing of C Programs
This paper describes a prototype tool, called SimC, which automatically generates test data for unit testing of C programs. The tool symbolically simulates the execution of the gi...
Zhongxing Xu, Jian Zhang
CICLING
2005
Springer
15 years 12 months ago
Learning the Query Generation Patterns
Abstract. With the current method of query formation, a Question Answering system retrieves a set of documents that are similar to a question, while what is mostly required is a se...
Marcin Skowron, Kenji Araki