4609 search results - page 153 / 922 » Automatic Generation of Sigma-Protocols |
149
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ISSRE
2008
IEEE
16 years 24 days ago
2008
IEEE
We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...
145
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DDECS
2007
IEEE
16 years 22 days ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
186
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SEW
2005
IEEE
15 years 12 months ago
2005
IEEE
Compared with texts, graphs are more intuitive to express comparative and structural information. Many graphical approaches, however, lack a formal basis for precise specification...
134
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FPL
2009
Springer
15 years 11 months ago
2009
Springer
Custom operators, working at custom precisions, are a key ingredient to fully exploit the FPGA flexibility advantage for high-performance computing. Unfortunately, such operators...
180
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EURODAC
1990
IEEE
15 years 10 months ago
1990
IEEE
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...