10890 search results - page 264 / 2178 » Automatic Complexity Analysis |
139
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
164
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MICCAI
2006
Springer
16 years 7 months ago
2006
Springer
Since the upturn of intravascular ultrasound (IVUS) as an imaging technique for the coronary artery system, much research has been done to simplify the complicated analysis of the ...
172
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CSO
2009
IEEE
16 years 1 months ago
2009
IEEE
Compared with the written word, few experts pay more attention to the spoken word because of the difficulty of obtaining spoken corpora. In order to develop and improve the spoken...
167
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IWPC
2009
IEEE
16 years 1 months ago
2009
IEEE
An approach is presented that automatically determines if a given source code change impacts the design (i.e., UML class diagram) of the system. This allows code-to-design traceab...
161
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SIGIR
2009
ACM
16 years 1 months ago
2009
ACM
Most existing automatic taxonomy induction systems exploit one or more features to induce a taxonomy; nevertheless there is no systematic study examining which are the best featur...