270 search results - page 19 / 54 » Automated test generation for industrial Erlang applications |
208
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IFIP
2001
Springer
15 years 10 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
181
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EVOW
2001
Springer
15 years 10 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
170
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KBSE
2007
IEEE
16 years 11 days ago
2007
IEEE
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
203
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GECCO
2004
Springer
15 years 11 months ago
2004
Springer
Abstract. The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural descript...
202
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CORR
2007
Springer
15 years 6 months ago
2007
Springer
This paper presents a methodology to efficiently explore the design space of communication adapters. In most digital signal processing (DSP) applications, the overall performance ...