3424 search results - page 70 / 685 » Automated Testing of Classes |
202
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ATS
2004
IEEE
15 years 10 months ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
170
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DATE
2009
IEEE
16 years 27 days ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
212
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ACSAC
2007
IEEE
16 years 15 days ago
2007
IEEE
We present an extension of traditional "black box" fuzz testing using a genetic algorithm based upon a Dynamic Markov Model fitness heuristic. This heuristic allows us t...
167
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LICS
1999
IEEE
15 years 10 months ago
1999
IEEE
An important open question in complexity theory is whether the circuit complexity class TC0 is (strictly) weaker than LOGSPACE. This paper considers this question from the viewpoi...
148
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CSL
2004
Springer
15 years 6 months ago
2004
Springer
Abstract. A new class of languages of infinite words is introduced, called the maxregular languages, extending the class of -regular languages. The class has two equivalent descrip...