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DAC
2000
ACM
16 years 7 months ago
Test challenges for deep sub-micron technologies
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...
DEBU
2008
156views more  DEBU 2008»
15 years 6 months ago
Towards Automatic Test Database Generation
Testing is one of the most expensive and time consuming activities in the software development cycle. In order to reduce the cost and the time to market, many approaches to automa...
Carsten Binnig, Donald Kossmann, Eric Lo
OOPSLA
2007
Springer
16 years 15 days ago
The design and implementation of formal monitoring techniques
In runtime monitoring, a programmer specifies a piece of code to execute when a trace of events occurs during program execution. Previous and related work has shown that runtime m...
Eric Bodden
FTCS
1993
111views more  FTCS 1993»
15 years 7 months ago
Detection and Discrimination of Injected Network Faults
Although the present work does in fact employ training data, it does so in the interest of calibrating the results Six hundred faults were induced by injection into five live obtai...
Roy A. Maxion, Robert T. Olszewski
EWCBR
1998
Springer
15 years 10 months ago
Similarity Measures for Object-Oriented Case Representations
Object-oriented case representations require approaches for similarity assessment that allow to compare two differently structured objects, in particular, objects belonging to diff...
Ralph Bergmann, Armin Stahl