Recently, processor power density has been increasing at an alarming rate resulting in high on-chip temperature. Higher temperature increases current leakage and causes poor relia...
Future SoCs will contain multiple cores. For workloads with significant parallelism, prior work has shown the benefit of many small, multi-threaded, scalar cores. For workloads th...
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Process variation has become a critical problem in modern VLSI fabrication. In the presence of process variation, buffer insertion problem under performance constraints becomes mo...
We describe the verification of the IM: a large, complex (12,000 gates and 1100 latches) circuit that detects and marks the boundaries between Intel architecture (IA-32) instructi...
Mark Aagaard, Robert B. Jones, Carl-Johan H. Seger