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TCAD
2010
136views more  TCAD 2010»
15 years 1 months ago
Bounded Model Debugging
Design debugging is a major bottleneck in modern VLSI design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical des...
Brian Keng, Sean Safarpour, Andreas G. Veneris
DAC
2007
ACM
16 years 7 months ago
Scan Test Planning for Power Reduction
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
166
Voted
SIGCOMM
2009
ACM
16 years 1 months ago
DECOR: DEClaritive network management and OpeRation
Network management operations are complicated, tedious and error-prone, requiring significant human involvement and expert knowledge. In this paper, we first examine the fundame...
Xu Chen, Yun Mao, Zhuoqing Morley Mao, Jacobus E. ...
190
Voted
DATE
2006
IEEE
96views Hardware» more  DATE 2006»
16 years 27 days ago
On the relation between simulation-based and SAT-based diagnosis
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
Görschwin Fey, Sean Safarpour, Andreas G. Ven...
SYNASC
2006
IEEE
91views Algorithms» more  SYNASC 2006»
16 years 25 days ago
MATHsAiD: A Mathematical Theorem Discovery Tool
In the eld of automated reasoning, one of the most challenging (even if, perhaps, somewhat overlooked) problems thus far has been to develop a means of discerning, from amongst al...
Roy L. McCasland, Alan Bundy