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ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
16 years 3 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
ICCAD
2007
IEEE
108views Hardware» more  ICCAD 2007»
16 years 3 months ago
Novel wire density driven full-chip routing for CMP variation control
— As nanometer technology advances, the post-CMP dielectric thickness variation control becomes crucial for manufacturing closure. To improve CMP quality, dummy feature filling ...
Huang-Yu Chen, Szu-Jui Chou, Sheng-Lung Wang, Yao-...
ICCAD
2007
IEEE
91views Hardware» more  ICCAD 2007»
16 years 3 months ago
Variation-aware task allocation and scheduling for MPSoC
— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. As a result, a paradigm shift from determ...
Feng Wang 0004, Chrysostomos Nicopoulos, Xiaoxia W...
ICCAD
2003
IEEE
149views Hardware» more  ICCAD 2003»
16 years 3 months ago
Algorithm for Achieving Minimum Energy Consumption in CMOS Circuits Using Multiple Supply and Threshold Voltages at the Module L
This paper proposes an optimum methodology for assigning supply and threshold voltages to modules in a CMOS circuit such that the overall energy consumption is minimized for a giv...
Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhij...
ICCAD
2003
IEEE
134views Hardware» more  ICCAD 2003»
16 years 3 months ago
Multi-Domain Clock Skew Scheduling
The application of general clock skew scheduling is practically limited due to the difficulties in implementing a wide spectrum of dedicated clock delays in a reliable manner. Th...
Kaushik Ravindran, Andreas Kuehlmann, Ellen Sentov...