Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
Modern processing technologies offer a number of types of devices such as high-VT , low-VT , thick-oxide, etc. in addition to the nominal transistor in order to meet system perfor...
Jintae Kim, Ritesh Jhaveri, Jason Woo, Chih-Kong K...
A clustering framework within the sparse modeling and dictionary learning setting is introduced in this work. Instead of searching for the set of centroid that best fit the data, ...
Pablo Sprechmann, Ignacio Ramirez, Guillermo Sapir...
This paper presents a framework for analyzing the performance of multithreaded programs using a model called a constraint graph. We review previous constraint graph definitions fo...