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ICCAD
2006
IEEE
141views Hardware» more  ICCAD 2006»
16 years 3 months ago
Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
Mihir R. Choudhury, Quming Zhou, Kartik Mohanram
ICASSP
2008
IEEE
16 years 1 months ago
Composite hypothesis testing by optimally distinguishable distributions
Relying on optimally distinguishable distributions (ODD), it was defined very recently a new framework for the composite hypothesis testing. We resort to the linear model to inve...
Seyed Alireza Razavi, Ciprian Doru Giurcaneanu
ICPR
2008
IEEE
16 years 1 months ago
Improving Bayesian Network parameter learning using constraints
This paper describes a new approach to unify constraints on parameters with training data to perform parameter estimation in Bayesian networks of known structure. The method is ge...
Cassio Polpo de Campos, Qiang Ji
3DIM
1999
IEEE
15 years 11 months ago
Faithful Recovering of Quadric Surfaces from 3D Range Data
The paper proposes a reliable method for estimating quadric surfaces from 3D range data in the framework of object recognition and localization or object modelling. Instead of est...
Naoufel Werghi, Anthony Ashbrook, Robert B. Fisher...
PAMI
2006
117views more  PAMI 2006»
15 years 6 months ago
Metric Learning for Text Documents
High dimensional structured data such as text and images is often poorly understood and misrepresented in statistical modeling. The standard histogram representation suffers from ...
Guy Lebanon