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DAC
2000
ACM
16 years 7 months ago
Embedded hardware and software self-testing methodologies for processor cores
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
Li Chen, Sujit Dey, Pablo Sanchez, Krishna Sekar, ...
DAC
2003
ACM
16 years 7 months ago
A scalable software-based self-test methodology for programmable processors
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
Li Chen, Srivaths Ravi, Anand Raghunathan, Sujit D...
DAC
2003
ACM
16 years 7 months ago
On-chip logic minimization
While Boolean logic minimization is typically used in logic synthesis, logic minimization can be useful in numerous other applications. However, many of those applications, such a...
Roman L. Lysecky, Frank Vahid
DAC
2004
ACM
16 years 7 months ago
Abstraction of assembler programs for symbolic worst case execution time analysis
ion of Assembler Programs for Symbolic Worst Case Execution Time Analysis Tobias Schuele Tobias.Schuele@informatik.uni-kl.de Klaus Schneider Klaus.Schneider@informatik.uni-kl.de Re...
Klaus Schneider, Tobias Schüle
DAC
2006
ACM
16 years 7 months ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
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