1682 search results - page 93 / 337 » Applying Conventional Testing Techniques for Class Testing |
168
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TCAD
1998
15 years 5 months ago
1998
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...
138
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PICS
2003
15 years 7 months ago
2003
A paired comparison psychophysical experiment was performed to evaluate the quality of several imaging techniques. Images rendered for an LCD were compared with two- and three-dim...
133
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AGP
1998
IEEE
15 years 10 months ago
1998
IEEE
We compare two (apparently) rather different set-based constraint languages, and we show that, in spite of their different origins and aims, there are large classes of constraint ...
134
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DATE
2007
IEEE
16 years 16 days ago
2007
IEEE
This paper describes a DfT solution for modern seriallink transceivers. We first summarize the architectures of the Crosstalk Canceller and the Equalizer used in advanced transcei...
170
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DAC
1997
ACM
15 years 10 months ago
1997
ACM
The biggest obstacle in the formal verification of large designs is their very large state spaces, which cannot be handled even by techniques such as implicit state space travers...