3142 search results - page 431 / 629 » Applied ontology issues |
142
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
149
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
Placement migration is a critical step to address a variety of postplacement design closure issues, such as timing, routing congestion, signal integrity, and heat distribution. To...
138
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ICCAD
2001
IEEE
16 years 3 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
170
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CHI
2010
ACM
16 years 1 months ago
2010
ACM
We are developing evaluation tools that help sustainable HCI researchers to contribute to the overall project of achieving sustainability. In this paper we argue for broadening su...
160
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EVOW
2010
Springer
16 years 1 months ago
2010
Springer
Computational evolutionary art has been an active practice for at least 20 years. Given the remarkable advances in that time in other realms of computing, including other forms of ...