1690 search results - page 57 / 338 » Applications of Metric Coinduction |
200
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ISSRE
2007
IEEE
15 years 7 months ago
2007
IEEE
In industrial practice, information on the software field quality of a product is available too late in the software lifecycle to guide affordable corrective action. An important ...
219
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CVPR
2009
IEEE
17 years 1 months ago
2009
IEEE
Multi-instance multi-label learning (MIML) refers to the
learning problems where each example is represented by a
bag/collection of instances and is labeled by multiple labels.
...
214
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CVPR
2012
IEEE
13 years 8 months ago
2012
IEEE
Mode-seeking has been widely used as a powerful data analysis technique for clustering and filtering in a metric feature space. We introduce a versatile and efficient modeseekin...
162
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SIGCOMM
2009
ACM
16 years 24 days ago
2009
ACM
The analysis of social and technological networks has attracted a lot of attention as social networking applications and mobile sensing devices have given us a wealth of real data...
162
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IROS
2007
IEEE
16 years 18 days ago
2007
IEEE
— Any system that has the capability to diagnose and recover from faults is considered to be a fault-tolerant system. Additionally, the quality of the incorporated fault-toleranc...