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» Applications of Fair Testing

140

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KBSE
1999
IEEE

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Automatic Generation of Test Oracles-From Pilot Studies to Application

15 years 10 months ago

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Martin S. Feather, Benjamin D. Smith

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122

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ITC
1998
IEEE

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An almost full-scan BIST solution-higher fault coverage and shorter test application time

15 years 10 months ago

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Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng

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130

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PODS
1996
ACM

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Testing Complex Temporal Relationships Involving Multiple Granularities and Its Application to Data Mining

15 years 10 months ago

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Claudio Bettini, Xiaoyang Sean Wang, Sushil Jajodi...

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141

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ICCAD
1993
IEEE

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Reconfigurable scan chains: a novel approach to reduce test application time

15 years 10 months ago

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Sridhar Narayanan, Melvin A. Breuer

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133

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ISSTA
1994
ACM

118views Software Engineering» more ISSTA 1994»

Testing a Safety-Critical Application

15 years 10 months ago

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