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DFT
2003
IEEE
154views VLSI» more  DFT 2003»
16 years 4 days ago
Fault Recovery Based on Checkpointing for Hard Real-Time Embedded Systems
Safety-critical embedded systems often operate in harsh environmental conditions that necessitate fault-tolerant computing techniques. Many safety-critical systems also execute re...
Ying Zhang, Krishnendu Chakrabarty
FCCM
2003
IEEE
210views VLSI» more  FCCM 2003»
16 years 4 days ago
Compact FPGA-based True and Pseudo Random Number Generators
Two FPGA based implementations of random number generators intended for embedded cryptographic applications are presented. The first is a true random number generator (TRNG) whic...
Kuen Hung Tsoi, K. H. Leung, Philip Heng Wai Leong
GLVLSI
2003
IEEE
161views VLSI» more  GLVLSI 2003»
16 years 4 days ago
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
Timm Ostermann, Bernd Deutschmann
158
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ISWC
2003
IEEE
16 years 3 days ago
Personal Position Measurement Using Dead Reckoning
This paper compares position measurement techniques using dead reckoning. We are seeking to find a technique which is suitable for use by pedestrians, and have compared a number ...
Cliff Randell, Chris Djiallis, Henk L. Muller
VTS
2003
IEEE
127views Hardware» more  VTS 2003»
16 years 3 days ago
Bist Reseeding with very few Seeds
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McC...