5570 search results - page 449 / 1114 » Applications of Fair Testing |
121
click to vote
DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
The fraction of ICs that pass all production tests but fail in the application is called the defect level. Defect levels depend on the average number of defects per IC, and also o...
146
click to vote
ICALT
2008
IEEE
16 years 1 months ago
2008
IEEE
The goal of this work is the design and construction of adaptive tutorials based on the application of algorithms for the automatic resolution of problems which can be used to aut...
181
Voted
ICIP
2007
IEEE
16 years 1 months ago
2007
IEEE
In this paper, we present an application of stable marriages algorithms, applied to level-line junctions, for obstacle detection. The method is implemented on our PiCar stereovisi...
149
click to vote
ITC
1998
IEEE
15 years 11 months ago
1998
IEEE
ABSTRACT - A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digi...
190
click to vote
COLING
2008
15 years 8 months ago
2008
The WordNet verb hierarchy is tested, with a view to improving the performance of its applications, revealing topological anomalies and casting doubt on its semantic categories. E...