5570 search results - page 445 / 1114 » Applications of Fair Testing |
166
click to vote
TCAD
2002
15 years 6 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
191
click to vote
ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
In this paper, we present and evaluate three temperature-sensitive loop parallelization strategies for array-intensive applications executed on chip multiprocessors in order to re...
184
click to vote
AINA
2008
IEEE
16 years 1 months ago
2008
IEEE
The Home Network is a pervasive environment by nature. Its openness to dynamic distributed and heterogeneous devices brings great challenges in home application design. We present...
139
click to vote
ICPR
2008
IEEE
16 years 1 months ago
2008
IEEE
In this paper, we propose a new method to reconstruct high resolution images from structured illumination microscopy. It consists of estimating the illumination pattern parameters...
162
Voted
IWANN
2007
Springer
16 years 28 days ago
2007
Springer
In this paper ensemble techniques have been applied in the frame of topology preserving mappings in two applications: classification and visualization. These techniques are applied...