5570 search results - page 164 / 1114 » Applications of Fair Testing |
153
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GLVLSI
2006
IEEE
16 years 11 days ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
153
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CEC
2005
IEEE
15 years 12 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
182
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SEFM
2005
IEEE
15 years 12 months ago
2005
IEEE
The development of test cases is an important issue for testing software, communication protocols and other reactive systems. A number of methods are known for the development of ...
154
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APAQS
2000
IEEE
15 years 10 months ago
2000
IEEE
In the manufacturing domain, few new distributed systems are built ground-up; most contain wrapped legacy components. While the legacy components themselves are already well-teste...
151
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DATE
2000
IEEE
15 years 10 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...