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VTS
2007
IEEE
103views Hardware» more  VTS 2007»
16 years 16 days ago
At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
Matthieu Tuna, Mounir Benabdenbi, Alain Greiner
EMSOFT
2005
Springer
15 years 11 months ago
Random testing of interrupt-driven software
Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using rand...
John Regehr
SAFECOMP
2005
Springer
15 years 11 months ago
Control and Data Flow Testing on Function Block Diagrams
As programmable logic controllers(PLCs) have been used in safety-critical applications, testing of PLC applications has become important. The previous PLC-based software testing te...
Eunkyoung Jee, Junbeom Yoo, Sung Deok Cha
KBSE
2002
IEEE
15 years 11 months ago
SeDiTeC - Testing Based on Sequence Diagrams
In this paper we present a concept for automated testing of object-oriented applications and a tool called SeDiTeC that implements these concepts for Java applications. SeDiTeC us...
Falk Fraikin, Thomas Leonhardt
DAC
2008
ACM
16 years 7 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...