In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Since battery life directly impacts the extent and duration of mobility, one of the key considerations in the design of a mobile embedded system should be to maximize the energy d...
Debashis Panigrahi, Sujit Dey, Ramesh R. Rao, Kani...
A memory leak in a garbage-collected program occurs when the program inadvertently maintains references to objects that it no longer needs. Memory leaks cause systematic heap grow...
Multimedia and network processing applications make extensive use of subword data. Since registers are capable of holding a full data word, when a subword variable is assigned a r...
CEL (Classifier for EL) is a reasoner for the small description logic EL+ which can be used to compute the subsumption hierarchy induced by EL+ ontologies. The most distinguishing ...
Franz Baader, Carsten Lutz, Boontawee Suntisrivara...