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DAC
2007
ACM
16 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
1999
ACM
16 years 7 months ago
Effective Iterative Techniques for Fingerprinting Design IP
While previous watermarking-based approaches to intellectual property protection (IPP) have asymmetrically emphasized the IP provider's rights, the true goal of IPP is to ens...
Andrew E. Caldwell, Hyun-Jin Choi, Andrew B. Kahng...
DAC
2000
ACM
16 years 7 months ago
Code compression for low power embedded system design
erse approaches at all levels of abstraction starting from the physical level up to the system level. Experience shows that a highlevel method may have a larger impact since the de...
Haris Lekatsas, Jörg Henkel, Wayne Wolf
DAC
2000
ACM
16 years 7 months ago
Fingerprinting intellectual property using constraint-addition
Recently, intellectual property protection (IPP) techniques attracted a great deal of attention from semiconductor, system integration and software companies. A number of watermar...
Gang Qu, Miodrag Potkonjak
DAC
2002
ACM
16 years 7 months ago
DRG-cache: a data retention gated-ground cache for low power
In this paper we propose a novel integrated circuit and architectural level technique to reduce leakage power consumption in high performance cache memories using single Vt (trans...
Amit Agarwal, Hai Li, Kaushik Roy
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