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ASPDAC
2001
ACM
82views Hardware» more  ASPDAC 2001»
15 years 10 months ago
Towards the logic defect diagnosis for partial-scan designs
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
Shi-Yu Huang
FAABS
2000
Springer
15 years 10 months ago
Formal Agent Development: Framework to System
Much work in the field of agent-based systems has tended to focus on either the development of practical applications of agent systems on the one hand, or the development of sophis...
Mark d'Inverno, Michael Luck
SI3D
1995
ACM
15 years 10 months ago
Surface Modification Tools in a Virtual Environment Interface to a Scanning Probe Microscope
The NanoManipulator system has been expanded from a virtualreality interface for a specific scanning tunneling microscope to include control of atomic force microscopes. The curre...
Mark Finch, Vernon L. Chi, Russell M. Taylor II, M...
WSC
2008
15 years 8 months ago
Calculating float in linear schedules with singularity functions
This paper presents an exact approach of calculating float for each activity in linear schedules. It is based on singularity functions, which have been used previously to determin...
Gunnar Lucko, Angel A. Pena Orozco
ASM
2008
ASM
15 years 8 months ago
Model Based Refinement and the Tools of Tomorrow
The ingredients of typical model based development via refinement are re-examined, and some well known frameworks are reviewed in that light, drawing out commonalities and differen...
Richard Banach