In this paper we propose a technique to determine accurate interconnect extraction corners for a 65-nm design using parametric RC extraction and timing analysis. We calculate the ...
Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa ...
Cryptographic techniques for reasoning about information leakage have recently been brought to bear on the classical problem of statistical disclosure control – revealing accurat...
We present a translation of a generic stochastic process algebra model into a form suitable for stochastic simulation. By systematically generating rate equations from a process d...
Jeremy T. Bradley, Stephen T. Gilmore, Nigel Thoma...
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
Abstract. This article presents a unified theory for analysis of components in discrete data, and compares the methods with techniques such as independent component analysis, non-...