In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
Abstract. In this paper we use colored Petri nets (CPNs) and the supporting CPN Tools for the modeling and performance analysis of grid architectures. The notation of Petri nets is...
Nikola Trcka, Wil M. P. van der Aalst, Carmen Brat...
In this paper we present preliminary results stemming from a novel application of Markov Models and Support Vector Machines to splice site classification of Intron-Exon and Exon-I...
Abstract. Using silhouettes in uncontrolled environments typically requires handling occlusions as well as changing or cluttered backgrounds, which limits the applicability of most...
The syntax of modeling languages is usually defined in two steps. The abstract syntax identifies modeling concepts whereas the concrete syntax clarifies how these modeling concepts...