135 search results - page 7 / 27 » Analog circuit test based on a digital signature |
147
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VTS
2003
IEEE
15 years 11 months ago
2003
IEEE
We present a novel analog checker that adjusts dynamically the error threshold to the magnitude of its input signals. We demonstrate that this property is crucial for accurate con...
164
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VTS
2002
IEEE
15 years 11 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...
148
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ASPDAC
2004
ACM
15 years 9 months ago
2004
ACM
This paper aims at developing an automated device-level placement for analog circuit design which achieves comparable quality to manual designs by experts. It extracts a set of cl...
173
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ISCAS
2006
IEEE
16 years 2 days ago
2006
IEEE
—This paper introduces a technique to measure and adjust the relative phase of on-chip high speed digital signals using a random sampling technique of inferential statistics. The...
186
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ISPD
2005
ACM
15 years 11 months ago
2005
ACM
Modern advances in reconfigurable analog technologies are allowing field-programmable analog arrays (FPAAs) to dramatically grow in size, flexibility, and usefulness. With thes...