135 search results - page 19 / 27 » Analog circuit test based on a digital signature |
163
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EH
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper describes a multi-objective Evolutionary Algorithm (EA) system for the synthesis of efficient non-linear VLSI circuit modules. The EA takes the specification for a no...
170
Voted
PCM
2009
Springer
15 years 10 months ago
2009
Springer
Abstract. In this paper, we propose an image moment-based geometric normalization to be applied before embedding and extracting a digital watermark in the DWT-domain of JPEG2000. A...
167
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ICES
2000
Springer
15 years 9 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
126
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DSD
2002
IEEE
15 years 11 months ago
2002
IEEE
We use a formal tool to extract Finite State Machines (FSM) based representations (lists of states and transitions) of sequential circuits described by flip-flops and gates. The...
137
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
The functional validation of a state-of-the-art digital design is usually performed by simulation of a register-transfer-level model. The degree to which the testvector suite cove...