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DATE
2007
IEEE
86views Hardware» more  DATE 2007»
16 years 1 months ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
IFIP
2007
Springer
16 years 27 days ago
Capable Leader and Skilled and Motivated Team Practices to Introduce eXtreme Programming
Abstract. Applying changes to software engineering processes in organisations usually raises many problems of varying nature. Basing on a real-world 2-year project and a simultaneo...
Lech Madeyski, Wojciech Biela
DRM
2005
Springer
16 years 9 days ago
DRM interoperability analysis from the perspective of a layered framework
Interoperability is currently seen as one of the most significant problems facing the digital rights management (DRM) industry. In this paper we consider the problem of interoper...
Gregory L. Heileman, Pramod A. Jamkhedkar
DIAGRAMS
2004
Springer
16 years 4 days ago
Bayesian Boxes: A Colored Calculator for Picturing Posteriors
The need for Bayesian inference arises in military intelligence, medical diagnosis and many other practical applications. The problem is that human inferences are generally conserv...
Kevin Burns
FOCS
2002
IEEE
15 years 11 months ago
Low-Dimensional Linear Programming with Violations
Two decades ago, Megiddo and Dyer showed that linear programming in two and three dimensions (and subsequently any constant number of dimensions) can be solved in linear time. In ...
Timothy M. Chan
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