As the geometry shrinking faces severe limitations, 3D wafer stacking with through silicon via (TSV) has gained interest for future SOC integration. Since TSV fill material and s...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
The trend towards integrating multiple cores on the same die has accentuated the need for larger on-chip caches. Such large caches are constructed as a multitude of smaller cache ...
Reetuparna Das, Asit K. Mishra, Chrysostomos Nicop...
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...
In this paper, we analyze the theoretical delay bound of the SHA-1 algorithm and propose architectures to achieve high throughput hardware implementations which approach this boun...