3120 search results - page 528 / 624 » An optimal architecture for a DDC |
170
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
As across-chip interconnect delays can exceed a clock cycle, wire pipelining becomes essential in high performance designs. Although it allows higher clock frequencies, it may cha...
148
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Scratch-pad memories (SPMs) enable fast access to time-critical data. While prior research studied both static and dynamic SPM management strategies, not being able to keep all ho...
185
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
: Due to exponential increase in subthreshold leakage with technology scaling and temperature increase, leakage power is becoming a major fraction of total power in the active mode...
147
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
123
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...