Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski,...
This paper presents a novel partial assignment technique (PAT) that decides which tasks should be assigned to the same resource without explicitly defining assignment of these tas...
Power consumption, particularly runtime leakage, in long on-chip buses has grown to an unacceptable portion of the total power budget due to heavy buffer insertion to combat RC de...
Harmander Deogun, Rajeev R. Rao, Dennis Sylvester,...
With process scaling, leakage power reduction has become one of the most important design concerns. Multi-threshold techniques have been used to reduce runtime leakage power witho...
Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Denn...
Current Static Timing Analysis (STA) techniques allow one to verify the timing of a circuit at different process corners which only consider cases where all the supplies are low o...