An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
Embedded systems with heterogeneous processors extend the energy/timing trade-off flexibility and provide the opportunity to fine tune resource utilization for particular applicat...
Michel Goraczko, Jie Liu, Dimitrios Lymberopoulos,...
The drive for low-power, high performance computation coupled with the extremely high design costs for ASIC designs, has driven a number of designers to try to create a flexible, ...
Alex Solomatnikov, Amin Firoozshahian, Wajahat Qad...
Off-chip decoupling capacitor (decap) allocation is a demanding task during package and chip codesign. Existing approaches can not handle large numbers of I/O counts and large num...