21094 search results - page 4011 / 4219 » An experiment using DLV-K |
168
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ICCD
2008
IEEE
16 years 3 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
417
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Lab
The Institute's mission is to produce excellent, innovative and nationalistic engineers and to advance the field of electrical and electronics engineering.
The undergr...
163
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
Abstract— As VLSI technology enters the nanoscale regime, interconnect delay becomes the bottleneck of circuit performance. Compared to gate delays, wires are becoming increasing...
166
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ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
Abstract— This paper addresses the module assignment problem in pinlimited designs under the stacked-Vdd circuit paradigm. A partition-based algorithm is presented for efficient...
115
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Most existing buffering algorithms neglect the impact of inductance on circuit performance, which causes large error in circuit analysis and optimization. Even for the approaches...