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TIP
2008
139views more  TIP 2008»
15 years 6 months ago
Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy
Abstract--Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, t...
François Aguet, Dimitri Van De Ville, Micha...
TISSEC
2008
202views more  TISSEC 2008»
15 years 6 months ago
A Framework for Identifying Compromised Nodes in Wireless Sensor Networks
compromised sensor nodes. The framework provides an appropriate abstraction of applicationspecific detection mechanisms and models the unique properties of sensor networks. Based o...
Qing Zhang, Ting Yu, Peng Ning
TKDE
2008
115views more  TKDE 2008»
15 years 6 months ago
A Niching Memetic Algorithm for Simultaneous Clustering and Feature Selection
Clustering is inherently a difficult task and is made even more difficult when the selection of relevant features is also an issue. In this paper, we propose an approach for simult...
Weiguo Sheng, Xiaohui Liu, Michael C. Fairhurst
TKDE
2008
146views more  TKDE 2008»
15 years 6 months ago
Toward Managing Uncertain Spatial Information for Situational Awareness Applications
Situational awareness (SA) applications monitor the real world and the entities therein to support tasks such as rapid decision making, reasoning, and analysis. Raw input about unf...
Yiming Ma, Dmitri V. Kalashnikov, Sharad Mehrotra
CCE
2005
15 years 6 months ago
On-line monitoring of a sugar crystallization process
The present paper reports a comparative evaluation of four multivariate statistical process control (SPC) techniques for the on-line monitoring of an industrial sugar crystallizat...
A. Simoglou, Petia Georgieva, E. B. Martin, A. J. ...