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EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
15 years 10 months ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel
ICLP
1993
Springer
15 years 10 months ago
Control Generation for Logic Programs
A basic requirement of declarative programming is to free the programmer from the need to manually insert control annotations into the program. Here we study the execution of logi...
Stefan Lüttringhaus-Kappel
CF
2007
ACM
15 years 10 months ago
Automated generation of layout and control for quantum circuits
We present a computer-aided design flow for quantum circuits, complete with automatic layout and control logic extraction. To motivate automated layout for quantum circuits, we in...
Mark Whitney, Nemanja Isailovic, Yatish Patel, Joh...
CAV
2010
Springer
179views Hardware» more  CAV 2010»
15 years 10 months ago
Generating Litmus Tests for Contrasting Memory Consistency Models
Well-defined memory consistency models are necessary for writing correct parallel software. Developing and understanding formal specifications of hardware memory models is a chal...
Sela Mador-Haim, Rajeev Alur, Milo M. K. Martin
BMVC
2002
15 years 9 months ago
Practical Generation of Video Textures using the Auto-Regressive Process
Recently, there have been several attempts at creating `video textures', that is, synthesising new (potentially infinitely long) video clips based on existing ones. One way t...
Neill W. Campbell, Colin J. Dalton, David P. Gibso...