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BIOADIT
2004
Springer
15 years 12 months ago
Distributed Central Pattern Generator Model for Robotics Application Based on Phase Sensitivity Analysis
Abstract. A method is presented to predict phase relationships between coupled phase oscillators. As an illustration of how the method can be applied, a distributed Central Pattern...
Jonas Buchli, Auke Jan Ijspeert
ICES
2003
Springer
79views Hardware» more  ICES 2003»
15 years 11 months ago
Using Genetic Programming to Generate Protocol Adaptors for Interprocess Communication
Abstract. As mobile devices become more powerful, interprocess communication becomes increasingly more important. Unfortunately, this larger freedom of mobility gives rise to unkno...
Werner Van Belle, Tom Mens, Theo D'Hondt
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
15 years 11 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
DATE
2000
IEEE
121views Hardware» more  DATE 2000»
15 years 11 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
EVOW
1999
Springer
15 years 11 months ago
Test Pattern Generation Under Low Power Constraints
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...