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ETS
2006
IEEE
119views Hardware» more  ETS 2006»
16 years 19 days ago
On-Chip Test Generation Using Linear Subspaces
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
Ramashis Das, Igor L. Markov, John P. Hayes
CEC
2005
IEEE
16 years 6 days ago
Elitist generational genetic chromodynamics - a new radii-based evolutionary algorithm for multimodal optimization
A new radii-based evolutionary algorithm (EA) designed for multimodal optimization problems is proposed. The approach can be placed within the genetic chromodynamics framework and ...
Catalin Stoean, Mike Preuss, Ruxandra Gorunescu, D...
CODES
2005
IEEE
16 years 6 days ago
Automatic network generation for system-on-chip communication design
With growing system complexities, system-level communication design is becoming increasingly important and advanced, network-oriented communication architectures become necessary....
Dongwan Shin, Andreas Gerstlauer, Rainer Döme...
ISMVL
2005
IEEE
90views Hardware» more  ISMVL 2005»
16 years 4 days ago
Test Generation and Fault Localization for Quantum Circuits
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
Marek A. Perkowski, Jacob Biamonte, Martin Lukac
ICS
2005
Tsinghua U.
16 years 2 days ago
Automatic generation and tuning of MPI collective communication routines
In order for collective communication routines to achieve high performance on different platforms, they must be able to adapt to the system architecture and use different algori...
Ahmad Faraj, Xin Yuan