9412 search results - page 149 / 1883 » An aspect-oriented generative approach |
201
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ISSTA
1998
ACM
15 years 10 months ago
1998
ACM
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
210
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VLSID
2010
IEEE
15 years 4 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
179
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ICCAD
2009
IEEE
15 years 4 months ago
2009
IEEE
As CMOS devices are scaled down into the nanometer regime, concerns about reliability are mounting. Instead of viewing nanoscale characteristics as an impediment, technologies suc...
183
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ICCV
2005
IEEE
16 years 8 months ago
2005
IEEE
We have developed a two-phase generative / discriminative learning procedure for the recognition of classes of objects and concepts in outdoor scenes. Our method uses both multipl...
155
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VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...