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DAC
1997
ACM
15 years 10 months ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
TACAS
1997
Springer
146views Algorithms» more  TACAS 1997»
15 years 10 months ago
Compositional State Space Generation from Lotos Programs
This paper describes a compositional approach to generate the labeled transition system representing the behavior of a Lotos program by repeatedly alternating composition and reduc...
Jean-Pierre Krimm, Laurent Mounier
DEXAW
2009
IEEE
114views Database» more  DEXAW 2009»
15 years 10 months ago
A Meta-Framework for Generating Ontologies from Legacy Schemas
A huge amount of schemas are expressed within outdated schema languages which are restricted concerning expressiveness, extensibility, readability, and understandability. Consequen...
Manuel Wimmer
HASE
2007
IEEE
15 years 10 months ago
Model Validation using Automatically Generated Requirements-Based Tests
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
ICCAD
1995
IEEE
120views Hardware» more  ICCAD 1995»
15 years 10 months ago
Pattern generation for a deterministic BIST scheme
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...