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TVCG
2012
203views Hardware» more  TVCG 2012»
13 years 9 months ago
Morse Set Classification and Hierarchical Refinement Using Conley Index
—Morse decomposition provides a numerically stable topological representation of vector fields that is crucial for their rigorous interpretation. However, Morse decomposition is ...
Guoning Chen, Qingqing Deng, Andrzej Szymczak, Rob...
DATE
2009
IEEE
125views Hardware» more  DATE 2009»
16 years 1 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
CGO
2007
IEEE
16 years 1 months ago
Ubiquitous Memory Introspection
Modern memory systems play a critical role in the performance of applications, but a detailed understanding of the application behavior in the memory system is not trivial to atta...
Qin Zhao, Rodric M. Rabbah, Saman P. Amarasinghe, ...
PATMOS
2007
Springer
16 years 23 days ago
Optimization for Real-Time Systems with Non-convex Power Versus Speed Models
Abstract. Until now, the great majority of research in low-power systems has assumed a convex power model. However, recently, due to the confluence of emerging technological and ar...
Ani Nahapetian, Foad Dabiri, Miodrag Potkonjak, Ma...
ISLPED
2006
ACM
83views Hardware» more  ISLPED 2006»
16 years 18 days ago
Considering process variations during system-level power analysis
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
Saumya Chandra, Kanishka Lahiri, Anand Raghunathan...