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» An LFT approach to parameter estimation
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DATE
2010
IEEE
171views Hardware» more  DATE 2010»
15 years 11 months ago
Digital statistical analysis using VHDL
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Manfred Dietrich, Uwe Eichler, Joachim Haase
RAS
2007
109views more  RAS 2007»
15 years 5 months ago
On point-to-point motion planning for underactuated space manipulator systems
In free-floating mode, space manipulator systems have their actuators turned off, and exhibit nonholonomic behavior due to angular momentum conservation. The system is underactua...
Ioannis Tortopidis, Evangelos Papadopoulos
PAMI
2010
184views more  PAMI 2010»
15 years 4 months ago
Accurate Image Search Using the Contextual Dissimilarity Measure
— This paper introduces the contextual dissimilarity measure which significantly improves the accuracy of bag-offeatures based image search. Our measure takes into account the l...
Herve Jegou, Cordelia Schmid, Hedi Harzallah, Jako...
PR
2010
156views more  PR 2010»
15 years 4 months ago
Semi-supervised clustering with metric learning: An adaptive kernel method
Most existing representative works in semi-supervised clustering do not sufficiently solve the violation problem of pairwise constraints. On the other hand, traditional kernel met...
Xuesong Yin, Songcan Chen, Enliang Hu, Daoqiang Zh...
3DIM
2005
IEEE
15 years 8 months ago
Bayesian Modelling of Camera Calibration and Reconstruction
Camera calibration methods, whether implicit or explicit, are a critical part of most 3D vision systems. These methods involve estimation of a model for the camera that produced t...
Rashmi Sundareswara, Paul R. Schrater