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146
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COMPSAC
2009
IEEE
16 years 1 months ago
2009
IEEE
Developing concurrent programs is intrinsically difficult. They are subject to programming errors that are not present in traditional sequential programs. Our current work is to ...
173
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
– In this paper, we present an open architecture Virtual Test Environment (VTE) which can be easily integrated into various modularized Automatic Test Systems (ATS) compliant to ...
159
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) st...
201
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
Many embedded control systems comprise several control loops that are closed over a network of computation nodes. In such systems, complex timing behavior and communication lead t...
181
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ICDM
2009
IEEE
16 years 1 months ago
2009
IEEE
—We propose a novel representative based subgraph mining model. A series of standards and methods are proposed to select invariants. Patterns are mapped into invariant vectors in...