Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
Most existing approaches for gene selection are based on evaluating the statistical relevance. However, there are remarkable discrepancies between statistical relevance and biolog...
A high accuracy system for transistor-level static timing analysis is presented. Accurate static timing verification requires that individual gate and interconnect delays be accu...
Pawan Kulshreshtha, Robert Palermo, Mohammad Morta...
Signal integrity analysis has become imperative for high-speed designs. In this paper, we present a new technique to advance Krylov-space based passive model-reduction algorithms ...
Emad Gad, Anestis Dounavis, Michel S. Nakhla, Rama...
In this paper we summarize parallel algorithms for enumerative model checking of properties formulated in linear time temporal logic (LTL) as well as a fragment of the µcalculus ...